Digital Microscope

Axsys Technologies' dual field of view, fully automated, single objective Microscope can be adapted to a variety of wafer and solar cell inspection technologies. The design features integrated illumination, dual cameras, active position feedback, and an integrated controller. High bandwidths can be achieved resulting in an overall increase in through put at the system level. The dual field of view cameras provide dedicated wide and narrow fields of view, allowing for quick target acquisition and high resolution target examination.

For more information about our Digital Microscope, please click on this link to download literature.